Fig. 1
From: Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography
Typical wheat spike, floret arrangement and grain traits. a Whole spike, b spikelet, c isolated grain, d grain cross section. Traits measured include: total height of the spike and grain position along the spike (a, b). Measured characteristics of isolated grains included grain length and width (c) as well as grain depth (d)